X-Ray Fluorescence Measuring Instrument with a Programmable X/Y-Stage and Z-Axis for Automated Measurements of very thin Coatings and for Trace Analysis
The FISCHERSCOPE X-RAY XDV-SDD is a universally applicable energy-dispersive x-ray fluorescence measuring instrument. It is especially well suited for measuring and analyzing very thin coatings or small concentrations in the trace analysis. With its high-precision, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
Typical fields of application are:
• Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 μm
• Trace analysis on pc boards according to RoHS and WEEE requirements
• Gold analysis
• Measurement of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the instrument features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity.
Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.
The fundamental parameter method by Fischer allows for the analysis of solid and liquid specimens as well as coating systems without calibration.
