Specific X-Ray Fluorescence Measuring Instruments for Measurements and Analyses of Coating Thicknesses and Compositions on Printed Circuit Boards
The FISCHERSCOPE X-RAY XDLM-PCB instruments are specific robust entry-level instruments for measurements and analyses of coating thicknesses and compositions on printed circuit boards.
Typical fields of application:
• Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in)
• Measurements of functional coatings in the electronics and semiconductor industries
• XDLM-PCB 210 and 220: Automated measurements, e.g., in quality control
• Determining the composition of electroplating baths
A high count rate is achieved by using a micro-focus X-ray source and a proportional counter tube, which allows for precise measurements. Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.
The fundamental parameter method by FISCHER allows for the analysis of solid and liquid specimens as well as coating systems without calibration. For measurements on large printed circuit boards and multi-panels, the XDLM-PCB 200 can be equipped with a sample stage extension to enlarge the usable sample placement area.
The XDLM-PCB 220 features electrically changeable apertures and primary filters to create ideal excitation conditions for every measurement. This makes the instrument extremely versatile.
