X-ray fluorescence spectrometer for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts.
The FISCHERSCOPE®-X-RAY XDLM® instruments are universally applicable energy-dispersive x-ray spectrometers. They constitute the next step in the development of the proven FISCHERSCOPE X-RAY XDLM-C4 model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analyses of thin coatings as well as for automated measurements on mass-produced parts and pc-boards.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Apertures and primary filters can be changed electrically to create the optimum measuring conditions for each measurement.
Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDLM x-ray spectrometers have an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things.
The instruments of the XDLM series are predestined for measuring and analyzing thin coatings, even at small concentrations. With the fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements in quality assurance and production monitoring.
Typical areas of application are:
•Measurement of mass-produced parts
•Inspection of thin coatings with small measurement spots
•Analysis of functional coatings in the electronics and semiconductor industries
•Automated measurements, e.g., on pc-boards
