High Performance X-Ray Fluorescence Measuring Instrument for fast and non-destructive Material Analysis and Coating Thickness Measurement
The FISCHERSCOPE X-RAY XAN 250 is a high performance, compact and universally applicable x-ray measuring instrument. It is well suited for the non-destructive coating thickness measurement and material analysis.
The XAN 250 is especially well suited for measuring and analyzing thin coatings, even with very complex compositions or small concentrations.
Typical fields of application:
• Measurement of functional coatings, starting from a few nanometers, in the electronics
and semiconductor industries
• Trace analysis for consumer protection, e.g. lead content in toys
• Analysis of alloys with highest requirements of accuracy in the jewelry and watch
industries and in metal refineries
• Research in universities and in the industries
The Fischer XRF spectrometers GOLDSCOPE SD 520 and 550 as well as XAN 220, 222, 250 and 252 are now equipped with the in-house developed digital pulse processor DPP+. In combination with the newlarger silicon drift detector of 50 mm² effective area.
An even higher count rate – i.e. more but also weaker fluorescence signals from the sample – can be processed with excellent energy resolution.
What does this mean in concrete terms? In short: significant advantages! Compared to the past, the absolute standard deviation can be reduced by up to 45 % at the same measurement time or the same standard deviation can be achieved in one third of the former measurement time. Raise your XRF measurements to a new level – of course with Fischer know-how!
