X-Ray Fluorescence in Thin film Solar Cell Manufacturing:
Improving cell efficiency and production yield
Production quality of thin film solar cells can be accurately and precisely monitored using the X-Ray Fluorescence (XRF) methodology. Specifically tailored inline measurement instruments are available that fulfil the robustness requirements in production environment. Clever software features enable simple setup and handling of the measurement instruments whilst ensuring stable measurement and maintaining comparability between them.
The main driver for continued PV growth is that a path to grid parity is now visible as production cost per watt continues to decline. The use of larger and more efficient production facilities is creating the economies of scale required for its competitiveness other sources of energy [4]. Whilst in 2007 the worldwide Silicon (Si)-based Solar Cell production dominated the global PV-market at approx. 94 percent market share [5], its market share is expected to decline to 80 percent in 2010
Thin film technologies mainly use compound semiconductors, namely CIS, CIGS and CdTe (Cadmium Telluride). CIS and CIGS consist of copper indium selenide and copper gallium selenide providing polycrystalline thin films. CIGS solar cells are not as efficient as crystalline silicon solar cells, but they are expected to be substantially cheaper. CIGS efficiency is by far the highest compared with those achieved by other thin film technologies such as CdTe or amorphous silicon (a-Si). These technologies are being commercialised rapidly and production facilities are ramped up.
Helmut Fischer-Fischerscope-xrf-x-ray-SDD-Solar Cell-992-061-x-ray
