X-Ray Fluorescence Spectrometers for Coating Thickness Measurement and Material Analysis
Knowledge, Competency, Experience that you can rely on
Based on this principle, FISCHER has developed innovative measuring technology for coating thickness measurement, material analysis, micro-hardness measurement and material testing since 1953. Today, measuring technology from FISCHER is employed around the world, where accuracy, precision and quality is required.
The development of powerful X-ray fluorescence spectrometers began back in 1981, when this technology was still largely unknown in the manufacturing industry. Very early, Fischer recognized the tremendous potential of this method for coating thickness measurement and material analysis and started to develop and manufacture industrial-strength measuring instruments.
The brand name FISCHERSCOPE® X-RAY was born.
With innovative solutions and numerous patents, FISCHER has shaped this technology with its reliable products to what it is today – an extremely powerful and sophisticated method for coating and material analysis. Today, after more than 10,000 X-ray spectrometers sold, the name FISCHERSCOPE® X-RAY has become synonymous with advanced X-ray fluorescence spectrometers.
Industry, research and science worldwide rely on the reliability and accuracy of the equipment. FISCHER rises to this challenge with consequent development, modern equipment and innovative software. Only what has been designed carefully and built perfectly can ultimately function optimally.
And only then does it deserve the name FISCHER.
You can rely on that.
