The new FISCHERSCOPE X-RAY XAN series are modern X-Ray fluorescence measuring instruments for coating thickness measurement and material analysis.
The XAN 220 is optimized for fast, non-destructive analysis of jewelry, precious metals, dental alloys, yellow and white gold, platinum, silver, rhodium and all jewelry alloys and coatings. Used properly, the XAN 220 can deliver comparable results as cupellation without destroying the sample.
The XAN 250 is an universal high performance analysis instrument. With electrically changeable apertures and primary filters, the XAN 250 can accurately determine elements in the range of Aluminum to Uranium. The applications range from trace analysis in toys to analysis of coatings in electronics.
Both instruments are equipped with a micro focus X-ray tube and a new high-resolution silicon drift detector (SDD). This results in highest precision and very low detection limits. In a matter of seconds, the elements of the sample are accurately determined.
In order to simplify sample placement, the X-ray source and the silicon drift detector are located in the
instrument‘s lower chamber. The measuring direction is from underneath the sample. The integrated videomicroscope with zoom, cross hair, illumination and beam indicator make sample placement quick and easy. There is no need to adjust a table or sample stage – just place and measure it.
