High Performance X-Ray Fluorescence Measuring Instrument with Vacuum Chamber for non-destructive Coating Thickness Measurement and Material Analysis
The FISCHERSCOPE X-RAY XUV 773 is an universally applicable energy dispersive X-ray measuring instrument. It is ideally suited for non-destructive analysis of thin coatings, traces and light elements. Up to 24 elements in the range of sodium (11) to uranium (92) can be determined simultaneously.
Measurements can be performed in vacuum, in ambient air or with helium purge (optional). Therefore also organic or wet samples can be analyzed.
The XUV 773 has changeable apertures and primary filters, which makes it ideal for complex tasks. With the integrated programmable X/Y/Z sample stage and a high resolution video camera the determination of the accurate measurement spot is easy and precise.
A modern Silicon Drift Detector (SDD) with an energy resolution better than 140 eV ensures outstanding analysis accuracy and detection sensitivity.
Typical fields of application:
• Analysis and coating thickness measurement on thin coatings like CIGS, CIS, CdTe
• Analysis and coating thickness measurement on functional coatings and in electronic and semiconductor industries
• Non-destructive analysis of gold, jewelry and gem stones
• Trace analysis and harmful substance analysis, RoHS, WEEE
Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.
Excellent ergonomics, easy operation, fast calculation and data presentation are further features of the XUV 773.
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