X-ray fluorescence spectrometer with a programmable X/Y-stage and Z-axis for automated measurements of thin coatings and for materials analysis.
The FISCHERSCOPE®-X-RAY XDAL®237 is a universally applicable energy-dispersive x-ray spectrometer. It constitutes the next step in the development of the proven FISCHERSCOPE X-RAY XDAL. Like its predecessor, it is particularly well suited for non-destructive measurements of very thin coatings and for analyses in automated measurement applications.
To create ideal excitation conditions for every measurement, the XDAL 237 features electrically changeable apertures and primary filters. The modern silicon PIN detector achieves a high analysis accuracy and a good detection sensitivity. The XDAL 237 x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things.
Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from aluminum (13) to uranium (92) simultaneously.
The XDAL 237 is predestined for measuring and analyzing very thin coatings, even with very complex compositions or small concentrations. With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated measurements in quality assurance and production monitoring.
Typical areas of application are:
• Analysis of thin or very thin coatings, e.g., gold and palladium coatings of ≤ 0.1 μm
• Measurement of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g., in quality control
• Determination of the lead content in solder
